La Milano

Testability & Meaning, Carnap, Rudolf, Good Book

Description: payment | shipping rates | returns Testability & Meaning Product Category : Books Title : Testability & Meaning Authors : Carnap, Rudolf Binding : paperback Publisher : Whitlock's Inc for the Graduate Publication Date : 1/1/1954 3:00:00 AM Signed : False First Edition : False Dust Jacket : False Weight : 1.0000 pounds Condition : Good Classification Notes : Good paperback, bumped/creased with shelfwear; may have previous owner's name inside. Standard-sized. 2nd printing About Midtown Scholar Bookstore ALL IMAGES PROVIDED ABOVE ARE PUBLISHER'S STOCK PHOTOS, based on a book's ISBN. For specific photos of individual books, please message us through eBay in advance of your purhcase. We will pull the book from our shelves to photograph and answer any questions you may have about its condition. Please note that a Good-condition used hardcover book may have a missing or torn dust jacket, if published with one. Our company is dedicated to excellence in customer service. We offer quality secondhand books in all academic fields. Since 2001. Our Harrisburg, Pennsylvania bookshop was honored to be Publishers Weekly's Bookstore of the Year! Payment We accept various payment options. Please see payment details listed above. Shipping Multiple shipping options are available for this item. For more detail, please see above, and select the shipping option that is most convenient for you. International Shipping: Import duties, taxes, and charges are NOT INCLUDED in the item price or shipping charges. These charges are the buyer's responsibility. Please check with your country's customs office to determine what these additional costs will be prior to bidding / buying. These charges are normally collected by the delivering freight (shipping) company or when you pick the item up do not confuse them for additional shipping charges. We do not mark merchandise values below value or mark items as "gifts." US and International government regulations prohibit such behavior. Returns Your satisfaction is very important to us. Please contact us via the methods available within eBay regarding any problems before leaving negative feedback. Any defects, damages, or material differences with your item, must be reported to us within 7 days of receipt of the item or 30 days from date of shipment. The returned merchandise must be postmarked within 30 days of the shipment notification. Non-deliveries must be reported within 30 days of Shipment Notification. © 2024 Midtown Scholar Bookstore

Price: 18.77 USD

Location: Harrisburg, Pennsylvania

End Time: 2025-01-19T01:57:02.000Z

Shipping Cost: 0 USD

Product Images

Testability & Meaning, Carnap, Rudolf, Good Book

Item Specifics

Restocking Fee: No

Return shipping will be paid by: Buyer

All returns accepted: Returns Accepted

Item must be returned within: 30 Days

Refund will be given as: Money Back

Author: Carnap, Rudolf

Publication Name: Testability & Meaning

Type: Textbook

Recommended

Advanced VLSI Design and Testability Issues (Paperback or Softback)
Advanced VLSI Design and Testability Issues (Paperback or Softback)

$65.13

View Details
Test and Design-for-Testability in Mixed-Signal Integrated Circuits by Jose Luis
Test and Design-for-Testability in Mixed-Signal Integrated Circuits by Jose Luis

$114.99

View Details
Logic Testing and Design for Testability, Paperback by Fujiwara, Hideo, Like ...
Logic Testing and Design for Testability, Paperback by Fujiwara, Hideo, Like ...

$58.42

View Details
Design for Testability, Debug and Reliability: Next Generation Measures Using Fo
Design for Testability, Debug and Reliability: Next Generation Measures Using Fo

$151.54

View Details
Test and Design-for-Testability in Mixed-Signal Integrated Circuits by Jose Luis
Test and Design-for-Testability in Mixed-Signal Integrated Circuits by Jose Luis

$190.81

View Details
Testability Concepts for Digital ICs: The Macro Test Approach by F.P.M. Beenker
Testability Concepts for Digital ICs: The Macro Test Approach by F.P.M. Beenker

$189.14

View Details
Team Guide to Software Testability: Better software through greater testability
Team Guide to Software Testability: Better software through greater testability

$16.76

View Details
System-on-Chip Test Architectures: Nanometer Design for Testability: Volume .
System-on-Chip Test Architectures: Nanometer Design for Testability: Volume .

$90.85

View Details
Logic Testing and Design for Testability, Paperback by Fujiwara, Hideo, Like ...
Logic Testing and Design for Testability, Paperback by Fujiwara, Hideo, Like ...

$49.09

View Details
Advanced Vlsi Design And Testability Issues
Advanced Vlsi Design And Testability Issues

$63.75

View Details