Description: Statistical Analysis of Spatial and Spatio-Temporal Point Patterns (Chapman & Hall/CRC Monographs on Statistics and Applied Probability)by Diggle, Peter J. Description: It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.Product ID: 1466560231-8-1
Price: 87.21 USD
Location: Philadelphia, Pennsylvania
End Time: 2024-11-24T01:18:33.000Z
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Book Title: Statistical Analysis of Spatial and Spatio-Temporal Point Pattern
Number of Pages: 268 Pages
Publication Name: Statistical Analysis of Spatial and Spatio-Temporal Point Patterns
Language: English
Publisher: CRC Press LLC
Subject: Probability & Statistics / General, Remote Sensing & Geographic Information Systems
Item Height: 0.9 in
Publication Year: 2013
Type: Textbook
Item Weight: 20 Oz
Subject Area: Mathematics, Technology & Engineering
Item Length: 9.5 in
Author: Peter J. Diggle
Series: Chapman and Hall/Crc Monographs on Statistics and Applied Probability Ser.
Item Width: 6.5 in
Format: Hardcover
