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Semiconductor Material and Device Characterization by Dieter K. Schroder (1998,

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Semiconductor Material and Device Characterization by Dieter K. Schroder (1998,Semiconductor Material and Device Characterization by Dieter K. Schroder (1998,

Item Specifics

Return shipping will be paid by: Buyer

All returns accepted: Returns Accepted

Item must be returned within: 14 Days

Refund will be given as: Money Back

Number of Pages: 784 Pages

Language: English

Publication Name: Semiconductor Material and Device Characterization

Publisher: Wiley & Sons, Incorporated, John

Publication Year: 1998

Item Height: 1.4 in

Subject: Electronics / Semiconductors

Features: Revised

Item Weight: 42.8 Oz

Type: Textbook

Item Length: 9.4 in

Author: Dieter K. Schroder

Subject Area: Technology & Engineering

Item Width: 6.4 in

Format: Hardcover

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