Description: Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45) [Paperback] Reimer, Ludwig and Hawkes, P.W. Product Overview Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information. Read more Details Publisher : Springer (December 1, 2010) Language : English Paperback : 543 pages ISBN-10 : 3642083722 ISBN-13 : 23 Item Weight : 1.66 pounds Dimensions : 6.1 x 1.23 x 9.25 inches Best Sellers Rank: #2,532,792 in Books (See Top 100 in Books) #40 in Electron Microscopes & Microscopy (Books) #427 in Solid-State Physics (Books) #645 in Physical & Theoretical Chemistry (Books) #40 in Electron Microscopes & Microscopy (Books) We have been selling used books since 2012, and we've learned that the most important thing is doing good business. Honesty is our policy. Free Shipping We ship worldwide. We have multiple warehouses around the world, so please note the extended handling time on certain listings.
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ISBN: 3642083722
ISBN10: 3642083722
ISBN13: 9783642083723
EAN: 9783642083723
MPN: does not apply
Brand: Springer
GTIN: 09783642083723
Number of Pages: Xiv, 529 Pages
Publication Name: Scanning Electron Microscopy : Physics of Image Formation and Microanalysis
Language: English
Publisher: Springer Berlin / Heidelberg
Publication Year: 2010
Subject: Physics / Condensed Matter, Spectroscopy & Spectrum Analysis, Electron Microscopes & Microscopy, Chemistry / Physical & Theoretical
Item Weight: 29.1 Oz
Type: Textbook
Author: Ludwig Reimer
Subject Area: Science
Item Length: 9.3 in
Item Width: 6.1 in
Series: Springer Series in Optical Sciences Ser.
Format: Trade Paperback
