Description: Quality Aspects in Spatial Data Miningby Stein, Alfred; Shi, Wenzhong; Bijker, Wietske Description: It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.Product ID: 1420069268-8-1
Price: 206.77 USD
Location: Philadelphia, Pennsylvania
End Time: 2025-02-03T01:18:14.000Z
Shipping Cost: 0 USD
Product Images
Item Specifics
Return shipping will be paid by: Seller
All returns accepted: Returns Accepted
Item must be returned within: 30 Days
Refund will be given as: Money Back
Return policy details:
Book Title: Quality Aspects in Spatial Data Mining
Number of Pages: 374 Pages
Publication Name: Quality Aspects in Spatial Data Mining
Language: English
Publisher: CRC Press LLC
Publication Year: 2008
Subject: Probability & Statistics / General, Environmental / General, Remote Sensing & Geographic Information Systems, Databases / Data Mining
Item Height: 1 in
Item Weight: 24.1 Oz
Type: Textbook
Author: Wenzhong Shi
Subject Area: Mathematics, Computers, Technology & Engineering
Item Length: 9.6 in
Item Width: 6.5 in
Format: Hardcover
