Description: Noncontact Atomic Force Microscopy, Paperback by Morita, Seizo (EDT); Giessibl, Franz J. (EDT); Wiesendanger, Roland (EDT), ISBN 3642260705, ISBN-13 9783642260704, Like New Used, Free shipping in the US Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, th exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.
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Book Title: Noncontact Atomic Force Microscopy
Number of Pages: Xviii, 401 Pages
Publication Name: Noncontact Atomic Force Microscopy : Volume 2
Language: English
Publisher: Springer Berlin / Heidelberg
Publication Year: 2012
Subject: Spectroscopy & Spectrum Analysis, Electron Microscopes & Microscopy, Chemistry / Physical & Theoretical, Nanotechnology & Mems
Type: Textbook
Item Weight: 22.6 Oz
Author: Franz J. Giessibl
Subject Area: Technology & Engineering, Science
Item Length: 9.3 in
Item Width: 6.1 in
Series: Nanoscience and Technology Ser.
Format: Trade Paperback
