Noncontact Atomic Force Microscopy by S. Morita (Springer, Hardcover, 2002)

Description: Noncontact Atomic Force Microscopy by S. Morita, R. Wiesendanger, E. Meyer (Springer, Hardcover, 2002). 439 pages. Nanoscience and Technology Series. Condition is Very Good; clean, firm binding, no writing or highlighting, no folded or torn pages. “Noncontact Atomic Force Microscopy,” edited by S. Morita, R. Wiesendanger, and E. Meyer, is a report on all methods related to noncontact atomic force microscopy (NC-AFM). Published in 2002, this book features contributions from leading experts in the field. Here are some key points: NC-AFM Basics: The book covers the principles of NC-AFM, which detects weak attractive forces between a cantilever tip and a sample surface. It achieves true atomic resolution and can measure atomic force interactions, study insulators, and assess mechanical responses like elastic deformation. Materials and Surfaces: Chapters delve into various materials and surfaces studied using NC-AFM. These include semiconductor surfaces, alkali halides, fluorides, and metal growth on oxides. The book explores atomic resolution imaging, surface reconstructions, and more. Emerging Issues: “Noncontact Atomic Force Microscopy” addresses emerging NC-AFM topics, making it the first comprehensive resource on this technique. It’s a valuable reference for researchers and a study text for graduate students interested in scanning probe microscopy. We welcome all offers and inquiries, more photos and information available upon request. Shipped securely and promptly with USPS mail.

Price: 70 USD

Location: Austin, Texas

End Time: 2024-09-20T22:42:32.000Z

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