Description: This reference focuses on the branch of electron spectroscopy generally labelled as either Electron Spectroscopy for Chemical Analysis (ESCA) or X-ray Photoelectron Spectroscopy (XPS). It emphasizes the use of core level and valence band binding energies, their shifts and line widths. It describes the background, present status and possible future uses of a number of recently developed branches of ESCA, including the changing shift and Fermi edge referencing, valance band analysis, XPS-induced loss spectroscopy, surface-to-bulk chemical shifts, small cluster analysis, photoelectron microscopy, inverse photoemission, resonance photoemission, photoemission of absorbed xenon, photoelecton diffraction and liquid phase photoemission. Analyses are described for various oxides, inert hydrocarbon polymers, carbon-filled metal ceramics, supported metals catalysts, unique structures and a variety of other systems. In addition, the book provides a general description of the use of ESCA to analyze such diverse systems as high Tc superconducting thin films and the leaves of trees during senescence. A detailed description of the air-induced chemical alteration of the surfaces of pure materials is also presented, and the potential use of ESCA in botany explored.
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EAN: 9780849386534
UPC: 9780849386534
ISBN: 9780849386534
MPN: N/A
Number of Pages: 376 Pages
Publication Name: Modern Escathe Principles and Practice of X-Ray Photoelectron Spectroscopy
Language: English
Publisher: CRC Press LLC
Publication Year: 1994
Subject: Lasers & Photonics, Radiation, Chemistry / Analytic, Chemistry / Industrial & Technical
Item Height: 0.9 in
Type: Textbook
Item Weight: 24.1 Oz
Subject Area: Technology & Engineering, Science
Author: Tery L. Barr
Item Length: 6.1 in
Item Width: 9.2 in
Format: Hardcover