Description: High Resolution Focused Ion Beams: FIB and its Applications by Jon Orloff, Mark Utlaut, Lynwood Swanson Estimated delivery 3-12 business days Format Paperback Condition Brand New Description In this book, we have attempted to produce a reference on high resolution focused ion beams (FIBs) that will be useful for both the user and the designer of FIB instrumentation. Publisher Description In this book, we have attempted to produce a reference on high resolution focused ion beams (FIBs) that will be useful for both the user and the designer of FIB instrumentation. We have included a mix of theory and applications that seemed most useful to us. The field of FIBs has advanced rapidly since the application of the first field emission ion sources in the early 1970s. The development of the liquid metal ion source (LMIS) in the late 1960s and early 1970s and its application for FIBs in the late 1970s have resulted in a powerful tool for research and for industry. There have been hundreds of papers written on many aspects of LMIS and FIBs, and a useful and informative book on these subjects was published in 1991 by Phil Prewett and Grame Mair. Because there have been so many new applications and uses found for FIBs in the last ten years we felt that it was time for another book on the subject. Details ISBN 1461352290 ISBN-13 9781461352297 Title High Resolution Focused Ion Beams: FIB and its Applications Author Jon Orloff, Mark Utlaut, Lynwood Swanson Format Paperback Year 2012 Pages 304 Edition 02200th Publisher Springer-Verlag New York Inc. GE_Item_ID:137859745; About Us Grand Eagle Retail is the ideal place for all your shopping needs! With fast shipping, low prices, friendly service and over 1,000,000 in stock items - you're bound to find what you want, at a price you'll love! Shipping & Delivery Times Shipping is FREE to any address in USA. Please view eBay estimated delivery times at the top of the listing. Deliveries are made by either USPS or Courier. We are unable to deliver faster than stated. International deliveries will take 1-6 weeks. NOTE: We are unable to offer combined shipping for multiple items purchased. This is because our items are shipped from different locations. Returns If you wish to return an item, please consult our Returns Policy as below: Please contact Customer Services and request "Return Authorisation" before you send your item back to us. Unauthorised returns will not be accepted. Returns must be postmarked within 4 business days of authorisation and must be in resellable condition. Returns are shipped at the customer's risk. We cannot take responsibility for items which are lost or damaged in transit. For purchases where a shipping charge was paid, there will be no refund of the original shipping charge. Additional Questions If you have any questions please feel free to Contact Us. Categories Baby Books Electronics Fashion Games Health & Beauty Home, Garden & Pets Movies Music Sports & Outdoors Toys
Price: 242.41 USD
Location: Fairfield, Ohio
End Time: 2025-01-23T03:43:44.000Z
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Restocking Fee: No
Return shipping will be paid by: Buyer
All returns accepted: Returns Accepted
Item must be returned within: 30 Days
Refund will be given as: Money Back
ISBN-13: 9781461352297
Book Title: High Resolution Focused Ion Beams: FIB and its Applications
Number of Pages: Xi, 304 Pages
Publication Name: High Resolution Focused Ion Beams: FIB and Its Applications : The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology
Language: English
Publisher: Springer
Publication Year: 2012
Subject: Materials Science / General, Materials Science / Electronic Materials, Physics / Nuclear, Physics / General
Item Height: 0.3 in
Item Weight: 17.4 Oz
Type: Textbook
Item Length: 9.3 in
Subject Area: Technology & Engineering, Science
Author: Lynwood Swanson, Jon Orloff, Mark Utlaut
Item Width: 6.1 in
Format: Trade Paperback
