Description: Fringe Pattern Analysis for Optical Metrology : Theory, Algorithms, and Applications, Hardcover by Servin, Manuel; Quiroga, J. Antonio; Padilla, J. Moises, ISBN 3527411526, ISBN-13 9783527411528, Like New Used, Free shipping in the US The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology.
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Book Title: Fringe Pattern Analysis for Optical Metrology : Theory, Algorithm
Number of Pages: 344 Pages
Language: English
Publication Name: Fringe Pattern Analysis for Optical Metrology : Theory, Algorithms, and Applications
Publisher: Wiley & Sons, Incorporated, John
Publication Year: 2014
Item Height: 0.9 in
Subject: Physics / Optics & Light, Optics
Type: Textbook
Item Weight: 31.7 Oz
Author: Manuel Servin, Moises Padilla, J. Antonio Quiroga
Item Length: 9.9 in
Subject Area: Technology & Engineering, Science
Item Width: 6.9 in
Format: Hardcover
