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End Time: 2025-01-26T11:11:46.000Z
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Book Title: Built in Test for VLSI: Pseudorandom Techniques
Publication Date: 1987-10-20
Pages: 368
Number of Pages: 368 Pages
Language: English
Publication Name: Built in Test for Vlsi : Pseudorandom Techniques
Publisher: Wiley & Sons, Incorporated, John
Publication Year: 1987
Subject: Electronics / Circuits / Vlsi & Ulsi, Electronics / General
Item Height: 0.9 in
Type: Textbook
Item Weight: 21.6 Oz
Author: J. Savir, Paul H. Bardell, W. H. Mcanney
Subject Area: Technology & Engineering
Item Length: 9.4 in
Item Width: 6.5 in
Format: Hardcover
