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Book Title: Atomic Force Microscopy: Understanding Basic Modes and Advanced A
Publication Date: 2012-10-16
Number of Pages: 528 Pages
Language: English
Publication Name: Atomic Force Microscopy : Understanding Basic Modes and Advanced Applications
Publisher: Wiley & Sons, Incorporated, John
Item Height: 1.2 in
Subject: Electron Microscopes & Microscopy, Microscopes & Microscopy
Publication Year: 2012
Type: Textbook
Item Weight: 28 Oz
Item Length: 9.6 in
Subject Area: Science
Author: Greg Haugstad
Item Width: 6.4 in
Format: Hardcover