Description: Advances in X-Ray Analysis: Volume 35b [Paperback] Barrett, C.S.; Gilfrich, J... Product Overview Details Publisher : Springer; Softcover reprint of the original 1st ed. 1992 edition (November 21, 2012) Language : English Paperback : 645 pages ISBN-10 : 1461365325 ISBN-13 : 27 Item Weight : 2.43 pounds Dimensions : 6.69 x 1.46 x 9.61 inches Quality Products Have peace of mind knowing that your order will arrive original factory sealed packaging. That means that you'll have the full force of the manufacturer's warranty to protect your purchase. Fast and Free Shipping You're already purchasing the item. Why pay additional for shipping, especially slow shipping? We get your order shipped out and delivered to your doorstep as quickly as possible. Commitment We are committed to making sure that you leave this transaction satisfied. That means having access to real people that get your questions and concerns answered quickly. Give us a shot and we will make sure that you will look to us again!
Price: 81.34 USD
Location: Wooster, Ohio
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Item Specifics
All returns accepted: ReturnsNotAccepted
Brand: Springer
MPN: black & white illustrations
ISBN: 1461365325
ISBN10: 1461365325
ISBN13: 9781461365327
EAN: 9781461365327
Item Length: 9.6in
Item Height: 0.5in
Item Width: 6.7in
Author: John V. Gilfrich
Publication Name: Advances in X-Ray Analysis : Volume 35b
Format: Trade Paperback
Language: English
Publisher: Springer
Publication Year: 2012
Type: Textbook
Item Weight: 38.8 Oz
Number of Pages: IV, 641 Pages
