Description: Good Used Hard cover
Price: 12.53 USD
Location: Sparks, Nevada
End Time: 2025-01-20T11:07:50.000Z
Shipping Cost: 0 USD
Product Images
Item Specifics
Return shipping will be paid by: Buyer
All returns accepted: Returns Accepted
Item must be returned within: 30 Days
Refund will be given as: Money Back
Book Title: Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Publication Date: 1986-03-31
Pages: 454
Number of Pages: Xii, 454 Pages
Publication Name: Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Language: English
Publisher: Springer
Publication Year: 1986
Subject: Materials Science / General, Pathology, Electron Microscopes & Microscopy, Microscopes & Microscopy
Type: Textbook
Item Weight: 66.3 Oz
Item Length: 9.2 in
Author: Dale E. Newbury, David C. Joy, Charles E. Fiori, Patrick Echlin, Joseph I. Goldstein
Subject Area: Technology & Engineering, Science, Medical
Item Width: 6.1 in
Format: Hardcover
