Description: Advanced Scanning Electron Microscopy and X-Ray Microanalysis by Echlin, Patrick; Fiori, C. E.; Goldstein, Joseph Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less
Price: 10.32 USD
Location: Aurora, Illinois
End Time: 2025-01-21T02:40:18.000Z
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Binding: Hardcover
Book Title: Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Weight: 2 lbs
Product Group: Book
IsTextBook: Yes
Number of Pages: Xii, 454 Pages
Language: English
Publication Name: Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Publisher: Springer
Subject: Materials Science / General, Pathology, Electron Microscopes & Microscopy, Microscopes & Microscopy
Publication Year: 1986
Item Weight: 66.3 Oz
Type: Textbook
Subject Area: Technology & Engineering, Science, Medical
Author: Dale E. Newbury, David C. Joy, Charles E. Fiori, Patrick Echlin, Joseph I. Goldstein
Item Length: 9.2 in
Item Width: 6.1 in
Format: Hardcover
